Invention Grant
- Patent Title: Location dependent sense time offset parameter for improvement to the threshold voltage distribution margin in non-volatile memory structures
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Application No.: US17554321Application Date: 2021-12-17
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Publication No.: US12027218B2Publication Date: 2024-07-02
- Inventor: Xue Bai Pitner , Prafful Golani , Ravi Kumar
- Applicant: SanDisk Technologies LLC
- Applicant Address: US TX Addison
- Assignee: SanDisk Technologies LLC
- Current Assignee: SanDisk Technologies LLC
- Current Assignee Address: US TX Addison
- Agency: Dickinson Wright PLLC
- Agent Steven C. Hurles
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/34 ; G11C16/26 ; H10B41/27 ; H10B43/27

Abstract:
A method for performing a program verify operation with respect to a target memory cell in a memory structure of a non-volatile memory system is provided. The method may include the step of determining a location of the target memory cell within the structure and, based upon the determined location of the target cell and with respect to each programmable memory state: (1) applying a first sense signal at a first point in time, and (2) applying a second sense signal at a second point in time. A time interval between the first and the second points in time is equal to a predetermined optimal time period plus or minus an offset parameter time value.
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