Invention Publication
- Patent Title: LOCATION DEPENDENT SENSE TIME OFFSET PARAMETER FOR IMPROVEMENT TO THE THRESHOLD VOLTAGE DISTRIBUTION MARGIN IN NON-VOLATILE MEMORY STRUCTURES
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Application No.: US17554321Application Date: 2021-12-17
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Publication No.: US20230197173A1Publication Date: 2023-06-22
- Inventor: Xue Bai Pitner , Prafful Golani , Ravi Kumar
- Applicant: SanDisk Technologies LLC
- Applicant Address: US TX Addison
- Assignee: SanDisk Technologies LLC
- Current Assignee: SanDisk Technologies LLC
- Current Assignee Address: US TX Addison
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C16/04

Abstract:
A method for performing a program verify operation with respect to a target memory cell in a memory structure of a non-volatile memory system, wherein the method may comprise determining a location of the target memory cell within the structure and, based upon the determined location of the target cell and with respect to each programmable memory state: (1) applying a first sense signal at a first point in time, and (2) applying a second sense signal at a second point in time, wherein a time interval between the first and the second points in time is equal to a predetermined optimal time period plus or minus an offset parameter time value.
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