Invention Grant
- Patent Title: Method for depositing silicon oxide film having improved quality by PEALD using bis(diethylamino)silane
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Application No.: US18077280Application Date: 2022-12-08
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Publication No.: US12033849B2Publication Date: 2024-07-09
- Inventor: Yuko Kengoyama , Hidemi Suemori , Ryu Nakano
- Applicant: ASM IP Holding B.V.
- Applicant Address: NL Almere
- Assignee: ASM IP Holding B.V.
- Current Assignee: ASM IP Holding B.V.
- Current Assignee Address: NL Almere
- Agency: Snell & Wilmer L.L.P.
- Main IPC: H01L21/02
- IPC: H01L21/02

Abstract:
In a method of depositing a silicon oxide film using bis(diethylamino)silane (BDEAS) on a substrate in a reaction space by plasma-enhanced atomic layer deposition (PEALD), each repeating deposition cycle of PEALD includes steps of: (i) adsorbing BDEAS on the substrate placed on a susceptor having a temperature of higher than 400° C. in an atmosphere substantially suppressing thermal decomposition of BDEAS in the reaction space; and (ii) exposing the substrate on which BDEAS is adsorbed to an oxygen plasma in the atmosphere in the reaction space, thereby depositing a monolayer or sublayer of silicon oxide.
Public/Granted literature
- US20230112490A1 METHOD FOR DEPOSITING SILICON OXIDE FILM HAVING IMPROVED QUALITY BY PEALD USING BIS(DIETHYLAMINO)SILANE Public/Granted day:2023-04-13
Information query
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