- 专利标题: High sensitivity phase microscopy imaging
-
申请号: US17273255申请日: 2019-09-04
-
公开(公告)号: US12038569B2公开(公告)日: 2024-07-16
- 发明人: Sylvain Gigan , Thomas Juffmann , Andrés De Los Ríos Sommer
- 申请人: Sorbonne Université , Centre National de la Recherche Scientifique , École Normale Supérieure de Paris
- 申请人地址: FR Paris
- 专利权人: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE,ÉCOLE NORMALE SUPÉRIEURE DE PARIS,SORBONNE UNIVERSITÉ
- 当前专利权人: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE,ÉCOLE NORMALE SUPÉRIEURE DE PARIS,SORBONNE UNIVERSITÉ
- 当前专利权人地址: FR Paris; FR Paris; FR Paris
- 代理机构: Maier & Maier, PLLC
- 优先权: EP 306171 2018.09.05
- 国际申请: PCT/EP2019/073576 2019.09.04
- 国际公布: WO2020/049041A 2020.03.12
- 进入国家日期: 2021-03-03
- 主分类号: G02B21/14
- IPC分类号: G02B21/14 ; G02B21/36
摘要:
A device for phase microscopy is disclosed that comprises a spatial light modulator and a connecting means adapted to fix the spatial light modulator onto a phase microscope. The phase microscope comprises a light path comprising at least a sample area, a light device for lighting said sample area, and an imaging device for capturing a phase image of said sample area. The phase image is a 2D matrix of pixels. The spatial light modulator is positioned in the light path in a conjugated plane of the sample area. The device also comprises a command of the spatial light modulator connected to the imaging device and adapted to measure the phase shift of a plurality of pixels of the phase image and to command the spatial light modulator in order to subtract the measured phase shifts.
公开/授权文献
- US20210325653A1 HIGH SENSITIVITY PHASE MICROSCOPY IMAGING 公开/授权日:2021-10-21
信息查询