Invention Grant
- Patent Title: Method and systems for removing anti-scatter grid artifacts in x-ray imaging
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Application No.: US17443810Application Date: 2021-07-27
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Publication No.: US12039745B2Publication Date: 2024-07-16
- Inventor: Ludovic Boilevin Kayl , Fabio Mattana , Vincent Jonas Bismuth , Romain Brevet , Fanny Patoureaux
- Applicant: GE Precision Healthcare LLC
- Applicant Address: US WI Milwaukee
- Assignee: GE PRECISION HEALTHCARE LLC
- Current Assignee: GE PRECISION HEALTHCARE LLC
- Current Assignee Address: US WI Milwaukee
- Agency: McCoy Russell LLP
- Main IPC: G06T5/70
- IPC: G06T5/70 ; G06T5/50 ; G06T7/00 ; G06T7/11 ; G06T7/37 ; G21K1/02

Abstract:
Various methods and systems are provided for x-ray imaging. In one embodiment, a method includes acquiring, with an x-ray detector, an x-ray image of a subject, determining a transformation that minimizes anti-scatter grid artifacts in the x-ray image, correcting the x-ray image according to the transformation to generate a corrected image, and outputting the corrected image. In this way, artifacts arising from a misalignment of an anti-scatter grid between the calibration and the acquisition may be reduced.
Public/Granted literature
- US20230030175A1 METHOD AND SYSTEMS FOR REMOVING ANTI-SCATTER GRID ARTIFACTS IN X-RAY IMAGING Public/Granted day:2023-02-02
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