- 专利标题: Layout structure including anti-fuse cell
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申请号: US17589590申请日: 2022-01-31
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公开(公告)号: US12048147B2公开(公告)日: 2024-07-23
- 发明人: Meng-Sheng Chang , Chia-En Huang , Wan-Hsueh Cheng , Yao-Jen Yang , Yih Wang
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Maschoff Brennan
- 分案原申请号: US16729973 2019.12.30
- 主分类号: G11C17/00
- IPC分类号: G11C17/00 ; G06F30/392 ; G11C17/16 ; G11C17/18 ; H01L23/522 ; H01L23/528 ; H10B20/20
摘要:
A structure includes first and second active areas, first and second gates and a data line. The first gate is continuous and crosses over the first active area and the second active area. The first gate corresponds to gate terminals of first and second transistors, and first source/drain regions of the first and the second active areas correspond to first source/drain terminals of the first and second transistors. The second gate includes first and second gate portions electrically isolated from each other. The first and second gate portions correspond to gate terminals of third and fourth transistors, respectively. The first gate portion crosses over the first active area, and the second gate portion crosses over the second active area. The first data line is coupled to the first source/drain regions of the first active area and the second active area.
公开/授权文献
- US20220157835A1 LAYOUT STRUCTURE INCLUDING ANTI-FUSE CELL 公开/授权日:2022-05-19
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