Invention Grant
- Patent Title: Image analysis method, image analysis apparatus, and image analysis program for analyzing cell with deep learning algorithm
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Application No.: US17197123Application Date: 2021-03-10
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Publication No.: US12056869B2Publication Date: 2024-08-06
- Inventor: Yoshinori Sasagawa , Yoshiaki Miyamoto , Kazumi Hakamada , Kengo Gotoh , Yosuke Sekiguchi
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe
- Agency: METROLEX IP LAW GROUP, PLLC
- Priority: JP 17088743 2017.04.27
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06N3/08 ; G06T7/11 ; G06T7/187 ; G06V20/69

Abstract:
An image analysis method according one or more embodiments may analyze a form of a cell using a deep learning algorithm with a structure of a neural network. The image analysis method may include: generating data for analysis from an image for analysis in which an analysis target cell is captured; inputting the data for analysis into the deep learning algorithm; and generating data indicating a form of the analysis target cell using the deep learning algorithm.
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