- Patent Title: Performing data integrity checks to identify defective wordlines
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Application No.: US17546425Application Date: 2021-12-09
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Publication No.: US12062394B2Publication Date: 2024-08-13
- Inventor: Jian Huang , Zhenming Zhou
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G11C16/10
- IPC: G11C16/10 ; G11C16/08 ; G11C16/26 ; G11C29/44 ; G11C29/12

Abstract:
Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising performing a write operation to program first data to a first set of memory cells addressable by a first wordline of a first plurality of wordlines of a block of the memory device; performing a read operation on a second wordline of the plurality of wordlines, wherein the second wordline is adjacent to the first wordline; determining a number of bits programmed in a first logical level in the second wordline; and responsive to determining that the number of bits set satisfies a threshold criterion, copying second data from the first block to a second block.
Public/Granted literature
- US20230186995A1 PERFORMING DATA INTEGRITY CHECKS TO IDENTIFY DEFECTIVE WORDLINES Public/Granted day:2023-06-15
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