Invention Grant
- Patent Title: Opportunistic background data integrity scans
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Application No.: US17666087Application Date: 2022-02-07
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Publication No.: US12067253B2Publication Date: 2024-08-20
- Inventor: Karl D. Schuh , William Richard Akin
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: NICHOLSON DE VOS WEBSTER & ELLIOTT LLP
- Main IPC: G06F12/00
- IPC: G06F12/00 ; G06F3/06

Abstract:
Exemplary methods, apparatuses, and systems include determining that a memory component to be subjected to a background data integrity scan does not currently satisfy an activity threshold. The background data integrity scan is delayed in response to determining memory component does not satisfy the activity threshold. In response to detecting a background data integrity scan trigger event, the background data integrity scan is performed.
Public/Granted literature
- US20230251779A1 OPPORTUNISTIC BACKGROUND DATA INTEGRITY SCANS Public/Granted day:2023-08-10
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