- 专利标题： Method and apparatus for spot-checking visual inspection system
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申请号： US18296995申请日： 2023-04-07
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公开(公告)号： US12067710B2公开(公告)日： 2024-08-20
- 发明人: Qian Wu , Jiwei Chen , Guannan Jiang
- 申请人： CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- 申请人地址： CN Ningde
- 专利权人： CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- 当前专利权人： CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- 当前专利权人地址： CN Ningde
- 代理机构： ANOVA LAW GROUP, PLLC
- 主分类号： G06T7/00
- IPC分类号： G06T7/00
摘要：
A spot-checking method for a visual inspection system includes obtaining a plurality of to-be-inspected images, inspecting the plurality of to-be-inspected images to obtain defect types and/or parameters of a target object in the plurality of to-be-inspected images, and confirming availability of the visual inspection system based on the defect types and/or the parameters.
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