-
公开(公告)号：US11915462B1
公开(公告)日：2024-02-27
申请号：US18202460
申请日：2023-05-26
发明人： Boxiong Huang , Zhiyu Wang , Guannan Jiang
CPC分类号： G06V10/25 , G06V10/44 , G06V10/82 , G06V2201/07
摘要： Embodiments of this application provide a method for detecting a target point in an image. The method may include: obtaining an image under test, where the image under test may include a structure-stable first target object and a structure-unstable second target object; and processing the image under test based on a target point detection model to obtain a target point in the image under test, where the target point may include a feature point on the structure-stable first target object and a feature point on the structure-unstable second target object.
-
2.发明公开公开(公告)号：US20240029240A1
公开(公告)日：2024-01-25
申请号：US18474262
申请日：2023-09-26
发明人： Zhiyu Wang , Xi Wang , Guannan Jiang
CPC分类号： G06T7/001 , G06T7/11 , G06T2207/30168 , G06T2207/20021 , G06T2207/30108
摘要： Disclosed, in one embodiment, are a method and device for detecting imaging consistency of a system, and a computer storage medium. The method includes: determining a target region in an image acquired by the system, where the target region is a partial region that includes a target object in the image acquired by the system; obtaining first image information of the target region; and detecting the imaging consistency of the system based on the first image information. By obtaining the first image information of the target region in the image acquired by the system and determining the imaging consistency of the system based on the first image information, this application can effectively detect the imaging consistency of the system and improve accuracy of product detection.
-
公开(公告)号：US12067710B2
公开(公告)日：2024-08-20
申请号：US18296995
申请日：2023-04-07
发明人： Qian Wu , Jiwei Chen , Guannan Jiang
IPC分类号： G06T7/00
CPC分类号： G06T7/001 , G06T2207/30108
摘要： A spot-checking method for a visual inspection system includes obtaining a plurality of to-be-inspected images, inspecting the plurality of to-be-inspected images to obtain defect types and/or parameters of a target object in the plurality of to-be-inspected images, and confirming availability of the visual inspection system based on the defect types and/or the parameters.
-
公开(公告)号：US11823326B2
公开(公告)日：2023-11-21
申请号：US18317067
申请日：2023-05-13
发明人： Guannan Jiang , Lili Han
CPC分类号： G06T15/506 , G06T7/55 , G06T19/20 , G06T2207/10028 , G06T2219/2012
摘要： An image processing method includes obtaining two-dimensional and three-dimensional images of an object, extracting luminance and depth information from the three-dimensional image to generate luminance and depth image for the object, graying the two-dimensional image to obtain a single-channel grayscale image, selecting at least three same-location points from each of the grayscale and luminance image, calculating a coordinate transformation matrix between the grayscale and luminance images based on coordinates of the at least three same-location points in each of the grayscale and luminance images, and aligning the two-dimensional image with the luminance and depth images based on the coordinate transformation matrix to obtain fused image data. The fused image data includes color information of the two-dimensional image and the luminance and depth information of the three-dimensional image.
-
公开(公告)号：US11948323B2
公开(公告)日：2024-04-02
申请号：US18131282
申请日：2023-04-05
发明人： Weilin Zhuang , Guannan Jiang , Annan Shu
摘要： Embodiments of this application provide a measurement method and a measurement apparatus. The measurement method includes: acquiring a first image and a second image of a target object, where the first image is acquired by a camera located on a non-backlight side of the target object, and the second image is acquired by a camera located on a backlight side of target object; and measuring the target object for size information according to the first image and the second image. The technical solution of this application can improve accuracy and precision of inspection while improving production efficiency.
-
公开(公告)号：US20240070840A1
公开(公告)日：2024-02-29
申请号：US18356232
申请日：2023-07-21
发明人： Zhiyu Wang , Xi Wang , Guannan Jiang
IPC分类号： G06T7/00
CPC分类号： G06T7/0004 , G06T2207/20084
摘要： Provided are a defect detection method and apparatus, and a computer-readable storage medium. Specifically, the method includes: obtaining a to-be-detected image; obtaining a feature map of the to-be-detected image based on the to-be-detected image, where the feature map of the to-be-detected image includes a feature map of spatial position coordinate information; and performing defect detection on the to-be-detected image based on the feature map of the to-be-detected image. By modifying a neural network structure of defect detection and extracting the feature map of spatial position coordinate information during the detection, this application makes the neural network for use of defect detection sensitive to a spatial position, thereby enhancing sensitivity of a detection neural network to the spatial position, and in turn, increasing accuracy of detecting some specific defect types by the detection neural network, and increasing accuracy of defect detection.
-
公开(公告)号：US11978189B2
公开(公告)日：2024-05-07
申请号：US18129819
申请日：2023-03-31
发明人： Guannan Jiang , Annan Shu , Qiangwei Huang
CPC分类号： G06T7/0002 , G06T7/11 , G06T7/136 , G06T2207/20081
摘要： Embodiments of this application provide a defect detection method and apparatus. The method includes: obtaining an image for inspection; performing anomaly detection on the image for inspection to obtain an anomaly region image corresponding to the image for inspection; and performing defect classification on the anomaly region image to obtain defect detection information of the image for inspection. The defect detection method of the embodiments of this application is divided into two steps of anomaly detection and defect classification. Anomaly detection is performed on the image for inspection first, and then defect classification needs to be performed only on an anomaly region, reducing the workload of defect classification, thereby improving the efficiency of defect detection.
-
公开(公告)号：US11935260B1
公开(公告)日：2024-03-19
申请号：US18187729
申请日：2023-03-22
发明人： Tianhui Wu , Fei Chen , Guannan Jiang
CPC分类号： G06T7/60 , G06T7/80 , G06T2207/30164 , G06T2207/30244
摘要： This application provides a method for measuring dimensions to reduce measurement time and improve production efficiency, including: obtaining a first image and a second image of a to-be-measured workpiece, where the first image and the second image are images captured by a first camera and a second camera at different positions respectively; extracting a first corner set of the to-be-measured workpiece from the first image and a second corner set of the to-be-measured workpiece from the second image separately; rectifying position coordinates of the first corner set and position coordinates of the second corner set to obtain a position coordinate value of the first corner set and a position coordinate value of the second corner set in a same coordinate system; and obtaining dimensions of the to-be-measured workpiece based on the position coordinate value of the first corner set and the position coordinate value of the second corner set.
-
公开(公告)号：US11915443B2
公开(公告)日：2024-02-27
申请号：US18303971
申请日：2023-04-20
发明人： Qiangwei Huang , Guannan Jiang , Zhiyu Wang
IPC分类号： G06T7/60
CPC分类号： G06T7/60 , G06T2207/20044
摘要： An image processing method includes searching for a next pixel of a skeleton branch of a target image based on an already-searched current pixel of the skeleton branch, and determining whether the skeleton branch is a burr branch based on a number of already-searched pixels of the skeleton branch.
-
公开(公告)号：US20240005469A1
公开(公告)日：2024-01-04
申请号：US18129819
申请日：2023-03-31
发明人： Guannan Jiang , Annan Shu , Qiangwei Huang
CPC分类号： G06T7/0002 , G06T2207/20081 , G06T7/136 , G06T7/11
摘要： Embodiments of this application provide a defect detection method and apparatus. The method includes: obtaining an image for inspection; performing anomaly detection on the image for inspection to obtain an anomaly region image corresponding to the image for inspection; and performing defect classification on the anomaly region image to obtain defect detection information of the image for inspection. The defect detection method of the embodiments of this application is divided into two steps of anomaly detection and defect classification. Anomaly detection is performed on the image for inspection first, and then defect classification needs to be performed only on an anomaly region, reducing the workload of defect classification, thereby improving the efficiency of defect detection.
-
-
-
-
-
-
-
-
-
搜索结果
18 条记录 (耗时 0.018 秒)
