Invention Grant
- Patent Title: Measurement method and measurement apparatus
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Application No.: US17133931Application Date: 2020-12-24
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Publication No.: US12075273B2Publication Date: 2024-08-27
- Inventor: Qian Zhang , Meng Deng , Daoming Liu , Shulan Feng
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Slater Matsil, LLP
- Priority: CN 1810669604.3 2018.06.26
- Main IPC: H04W24/10
- IPC: H04W24/10 ; H04W36/00

Abstract:
This application provides a measurement method and a measurement apparatus. The measurement method includes: adding, by a network device, information about one frequency band or a plurality of frequency bands to measurement configuration information delivered to a terminal device; determining, by the terminal device, a corresponding radio frequency link channel configuration parameter by using the information about the one frequency band or the plurality of frequency bands; and measuring, by the terminal device, a measurement object based on the radio frequency link channel configuration parameter, and reporting a measurement result to the network device.
Public/Granted literature
- US20210120446A1 Measurement Method and Measurement Apparatus Public/Granted day:2021-04-22
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