- 专利标题: Stacked wafer structure and method for forming the same
-
申请号: US17394977申请日: 2021-08-05
-
公开(公告)号: US12080544B2公开(公告)日: 2024-09-03
- 发明人: Yu-Chen Chang , Chien-Wen Lai , Chih-Min Hsiao
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 主分类号: H01L21/02
- IPC分类号: H01L21/02 ; H01L21/304 ; H01L25/065
摘要:
A method includes bonding a front side surface of a first wafer to a second wafer; performing a multi-trimming process on the first and second wafers from a back side surface of the first wafer, the multi-trimming process comprising: performing a first trimming step from the back side surface of the first wafer to cut through a periphery of the first wafer; performing a second trimming step on the second wafer to partially cut a periphery of the second wafer to form a first step-like structure; and performing a third trimming step on the second wafer to partially cut the periphery of the second wafer to form a second step-like structure connecting down from the first step-like structure; after performing the multi-trimming process, forming a coating material at least over the periphery of the second wafer.
公开/授权文献
- US20220344150A1 STACKED WAFER STRUCTURE AND METHOD FOR FORMING THE SAME 公开/授权日:2022-10-27
信息查询
IPC分类: