- 专利标题: Quality metric signaling for beam strength prediction
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申请号: US17404777申请日: 2021-08-17
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公开(公告)号: US12089242B2公开(公告)日: 2024-09-10
- 发明人: Hamed Pezeshki , Tao Luo , Arumugam Chendamarai Kannan , Philip Aaron Sisk , Taesang Yoo , Mahmoud Taherzadeh Boroujeni
- 申请人: QUALCOMM Incorporated
- 申请人地址: US CA San Diego
- 专利权人: QUALCOMM Incorporated
- 当前专利权人: QUALCOMM Incorporated
- 当前专利权人地址: US CA San Diego
- 主分类号: H04W72/54
- IPC分类号: H04W72/54 ; G06N20/00 ; H04W24/10 ; H04W72/044 ; H04W72/542
摘要:
Certain aspects of the present disclosure provide techniques for predicting a strength of a transmission beam in a communication system. In one example, the disclosure describes a user equipment (UE) receiving a quality metric from a base station (BS), the quality metric indicating one or more tolerance levels for predicted beam strength as compared to actual beam strength at the UE. In some examples, the UE may transmit, to the BS, one or more indications of actual beam strength as measured at the UE at one or more time periods for one or more transmit beams of the BS.
公开/授权文献
- US20230053589A1 QUALITY METRIC SIGNALING FOR BEAM STRENGTH PREDICTION 公开/授权日:2023-02-23
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