Invention Grant
- Patent Title: Fine dust measurement module and fine dust measurement device
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Application No.: US17682858Application Date: 2022-02-28
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Publication No.: US12105000B2Publication Date: 2024-10-01
- Inventor: Ilhwan Kim , Sejin Yook , Gibong Sung , Seokwhan Chung
- Applicant: SAMSUNG ELECTRONICS CO., LTD. , IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY)
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.,IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY)
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.,IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY)
- Current Assignee Address: KR Suwon-si; KR Seoul
- Agency: Sughrue Mion, PLLC
- Priority: KR 20210109638 2021.08.19
- Main IPC: G01N15/02
- IPC: G01N15/02 ; G01N1/22 ; G01N15/06 ; G01N15/00 ; G01N15/10

Abstract:
There is provided a fine dust measurement module that includes a fluid inlet into which fluid including fine dust with particles of various diameters is flowed, a first channel through which, of the fine dust introduced through the fluid inlet, first fine dust with particles having a diameter greater than or equal to a first diameter passes, a second channel through which, of the fine dust introduced through the fluid inlet, second fine dust with particles having a diameter less than the first diameter passes, a flow ratio control nozzle arranged in the first channel and configured to control a flow ratio between fluid flowing into the first channel and fluid flowing into the second channel, and a fine dust sensor configured to sense fine dust flowing into the second channel.
Public/Granted literature
- US20230056602A1 FINE DUST MEASUREMENT MODULE AND FINE DUST MEASUREMENT DEVICE Public/Granted day:2023-02-23
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