- 专利标题: Damage evaluation device and damage evaluation method
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申请号: US17879919申请日: 2022-08-03
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公开(公告)号: US12105050B2公开(公告)日: 2024-10-01
- 发明人: Yuuki Nagai , Masahiro Hato , Hiroaki Hatanaka
- 申请人: IHI CORPORATION
- 申请人地址: JP Tokyo
- 专利权人: IHI CORPORATION
- 当前专利权人: IHI CORPORATION
- 当前专利权人地址: JP Tokyo
- 优先权: JP 20102049 2020.06.12
- 主分类号: G01N29/04
- IPC分类号: G01N29/04 ; G01N29/06 ; G01N29/26 ; G01N33/207
摘要:
A damage evaluation device includes: a phased array probe that irradiates an ultrasonic signal from a surface of an inspection metal toward an inside of the inspection metal and detects a reflection signal reflected in a predetermined region inside the inspection metal; and an arithmetic processor. The arithmetic processor sets planes parallel to each other in an inspection region, calculates pixel data by quantifying the reflection signal from segments set in each of the planes; calculates a scattering degree of the pixel data, and evaluates damage of the inspection metal based on the scattering degree.
公开/授权文献
- US20220381741A1 DAMAGE EVALUATION DEVICE AND DAMAGE EVALUATION METHOD 公开/授权日:2022-12-01
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