Disclosed is a method for testing an array substrate, including: sequentially applying a curing drive signal to curing pad circuits according to an arrangement order of the curing pad circuits in a testing circuit board, the curing pad circuit is connected with at least two array substrates; and performing an array test on the array substrates in the curing pad circuit by the curing drive signal. The present application also discloses a device for testing an array substrate, and a computer readable storage medium.