发明授权
- 专利标题: Memory device
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申请号: US18154726申请日: 2023-01-13
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公开(公告)号: US12119084B2公开(公告)日: 2024-10-15
- 发明人: Qiang Tang , Chunyuan Hou
- 申请人: Yangtze Memory Technologies Co., Ltd.
- 申请人地址: CN Hubei
- 专利权人: Yangtze Memory Technologies Co., Ltd.
- 当前专利权人: Yangtze Memory Technologies Co., Ltd.
- 当前专利权人地址: CN Wuhan
- 代理机构: Hanley, Flight & Zimmerman, LLC
- 主分类号: G11C8/08
- IPC分类号: G11C8/08 ; H10B63/00
摘要:
A memory device includes a first substrate, a first memory array, a second substrate, and at least one first vertical transistor. The first memory array is disposed on the first substrate. The first memory array includes at least one first word line structure. The first memory array is disposed between the first substrate and the second substrate in a vertical direction. The first vertical transistor is electrically connected with the first word line structure. At least a part of the at least one first vertical transistor is disposed in the second substrate.
公开/授权文献
- US20230154510A1 MEMORY DEVICE 公开/授权日:2023-05-18
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