- 专利标题: Semiconductor device structure with resistive element
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申请号: US18333124申请日: 2023-06-12
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公开(公告)号: US12119262B2公开(公告)日: 2024-10-15
- 发明人: Wen-Sheh Huang , Hsiu-Wen Hsueh , Yu-Hsiang Chen , Chii-Ping Chen
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 分案原申请号: US15865845 2018.01.09
- 主分类号: H01L21/768
- IPC分类号: H01L21/768 ; H01L21/311 ; H01L21/762 ; H01L27/06 ; H01L49/02
摘要:
A semiconductor device structure is provided. The semiconductor device structure includes a first dielectric layer and a first conductive feature and a second conductive feature surrounded by the first dielectric layer. The semiconductor device structure also includes a second dielectric layer over the first dielectric layer and a resistive element electrically connected to the first conductive feature. The second dielectric layer surrounds a portion of the resistive element. The semiconductor device structure further includes a conductive via electrically connected to the second conductive feature. The second dielectric layer surrounds a portion of the conductive via, and a contact area between the resistive element and the first conductive feature is wider than a contact area between the conductive via and the second conductive feature.
公开/授权文献
- US20230326795A1 SEMICONDUCTOR DEVICE STRUCTURE WITH RESISTIVE ELEMENT 公开/授权日:2023-10-12
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