- 专利标题: Very low voltage I/O circuit and method for screening defects
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申请号: US17960078申请日: 2022-10-04
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公开(公告)号: US12126334B2公开(公告)日: 2024-10-22
- 发明人: Hector Sanchez , Thomas Henry Luedeke , Stephen Robert Traynor
- 申请人: NXP USA, Inc.
- 申请人地址: US TX Austin
- 专利权人: NXP USA, Inc.
- 当前专利权人: NXP USA, Inc.
- 当前专利权人地址: US TX Austin
- 主分类号: H03K17/687
- IPC分类号: H03K17/687 ; H03K19/0185 ; H03K19/20
摘要:
A GPIO includes a transmitter having an output stage connected to the I/O pad and adapted to supply transmit data to an I/O pad in response to output data generated by a low voltage core logic operating within a functional voltage range for transmit operations; a receiver adapted to supply receive data to the low voltage core logic operating within the functional voltage range in response to input data received at the I/O pad for receive operations; a VLV transmitter adapted to supply VLV transmit data to the output stage of the transmitter and not directly to the I/O pad in response to output test data generated by the low voltage core logic; and a VLV receiver adapted to supply VLV receive data to the low voltage core logic operating within a low core supply voltage range in response to input data received from the output stage of the transmitter.
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