Invention Grant
- Patent Title: Clog detection via image analytics
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Application No.: US17941914Application Date: 2022-09-09
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Publication No.: US12136225B2Publication Date: 2024-11-05
- Inventor: Yash Chhabra , Abyaya Dhar , Boon Sen Chan , Yenwei Hung , Sidda Reddy Kurakula , Chandrasekhar Roy , Chih Chuan Wang
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Lowenstein Sandler LLP
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/194

Abstract:
A method includes identifying an image of a substrate processing equipment part that forms a plurality of holes. The method further includes determining, by a processing device based on the image, a corresponding neighboring angular distance of each of the plurality of holes and a corresponding area of each of the plurality of holes. The method further includes identifying, by the processing device, a first subset of the plurality of holes that are at least partially clogged based on at least one of the corresponding neighboring angular distance or the corresponding area of each of the plurality of holes. A corrective action associated with the substrate processing equipment part is to be performed based on the first subset of the plurality of holes that are at least partially clogged.
Public/Granted literature
- US20240087135A1 CLOG DETECTION VIA IMAGE ANALYTICS Public/Granted day:2024-03-14
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