Invention Grant
- Patent Title: Analysis system, method, and program
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Application No.: US17641211Application Date: 2019-09-27
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Publication No.: US12149554B2Publication Date: 2024-11-19
- Inventor: Hirofumi Ueda , Yoshinobu Ohta , Tomohiko Yagyu , Norio Yamagaki
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- International Application: PCT/JP2019/038324 WO 20190927
- International Announcement: WO2021/059519 WO 20210401
- Main IPC: G06F21/57
- IPC: G06F21/57 ; H04L9/40

Abstract:
Provided is an analysis system that allows a security administrator to understand the impact of known vulnerabilities on the system to be diagnosed. The topology identification unit 14 identifies network topology of devices included in a system to be diagnosed. The analysis unit 6 generates an attack pattern that includes an attack condition, an attack result, an attack means that is vulnerability that is used by an attack, and a segment where the attack can occur in the system to be diagnosed. The display control unit 8 displays segments included in attack patterns superimposed on the network topology, on a display device. At this time, the display control unit 8 changes a display mode of the segment according to a type of the vulnerability that corresponds to the attack means included in the attack pattern including the segment.
Public/Granted literature
- US20240056464A1 ANALYSIS SYSTEM, METHOD, AND PROGRAM Public/Granted day:2024-02-15
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