Invention Publication
- Patent Title: ANALYSIS SYSTEM, METHOD, AND PROGRAM
-
Application No.: US17641211Application Date: 2019-09-27
-
Publication No.: US20240056464A1Publication Date: 2024-02-15
- Inventor: Hirofumi UEDA , Yoshinobu OHTA , Tomohiko YAGYU , Norio YAMAGAKI
- Applicant: NEC Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Minato-ku, Tokyo
- International Application: PCT/JP2019/038324 2019.09.27
- Date entered country: 2022-03-08
- Main IPC: H04L9/40
- IPC: H04L9/40

Abstract:
Provided is an analysis system that allows a security administrator to understand the impact of known vulnerabilities on the system to be diagnosed. The topology identification unit 14 identifies network topology of devices included in a system to be diagnosed. The analysis unit 6 generates an attack pattern that includes an attack condition, an attack result, an attack means that is vulnerability that is used by an attack, and a segment where the attack can occur in the system to be diagnosed. The display control unit 8 displays segments included in attack patterns superimposed on the network topology, on a display device. At this time, the display control unit 8 changes a display mode of the segment according to a type of the vulnerability that corresponds to the attack means included in the attack pattern including the segment.
Public/Granted literature
- US12149554B2 Analysis system, method, and program Public/Granted day:2024-11-19
Information query