Invention Grant
- Patent Title: Semiconductor package having a high reliability
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Application No.: US18409778Application Date: 2024-01-10
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Publication No.: US12183718B2Publication Date: 2024-12-31
- Inventor: Ji-Hwan Hwang , Sang-Sick Park , Tae-Hong Min , Geol Nam
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: F. CHAU & ASSOCIATES, LLC
- Priority: KR10-2016-0020695 20160222
- Main IPC: H01L25/065
- IPC: H01L25/065 ; H01L21/56 ; H01L23/00 ; H01L23/31 ; H01L25/00 ; H01L25/10

Abstract:
A semiconductor package includes a package substrate, a plurality of semiconductor devices stacked on the package substrate, a plurality of underfill fillets disposed between the plurality of semiconductor devices and between the package substrate and the plurality of semiconductor devices, and a molding resin at least partially surrounding the plurality of semiconductor devices and the plurality of underfill fillets. The plurality of underfill fillets include a plurality of protrusions that protrude from spaces between each of the plurality of semiconductor devices or between the package substrate and each of the plurality of semiconductor devices. At least two neighboring underfill fillet protrusions of the plurality of protrusions form one continuous structure without an interface therebetween.
Public/Granted literature
- US20240145437A1 SEMICONDUCTOR PACKAGE HAVING A HIGH RELIABILITY Public/Granted day:2024-05-02
Information query
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