Provided is a probe device for testing a sensor chip that detects a target material from an analysis specimen, has a reactant reacting specifically with the target material, and transmits a generated electrical signal through a pad. The probe device can include a lower housing accommodating a circuit board electrically connectable to an external test device; a middle housing positioned on the lower housing, coupled to the lower housing, and having the sensor chip mounted thereon; a probe module having probe pins for connecting a pad of the sensor chip and a connection pad of the circuit board to each other; and an upper housing positioned on the middle housing, coupled to the middle housing, having a recessed portion that opens the sensor chip, and having a guide area for aligning the probe module on the pads of the sensor chip and the circuit board.