Invention Grant
- Patent Title: Gain and offset diagnosis of analog-to-digital converters in sensor signal path
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Application No.: US18146641Application Date: 2022-12-27
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Publication No.: US12218679B2Publication Date: 2025-02-04
- Inventor: Dan Ioan Dumitru Stoica , Constantin Crisu , Constantin Stroi , Vlad Buiculescu , Matthias Böhm , Alessandro Caspani , Cesare Buffa , Franz Michael Darrer
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Harrity & Harrity, LLP
- Main IPC: H03M1/10
- IPC: H03M1/10 ; G10L21/0232 ; H03M1/06 ; H03M1/34

Abstract:
A sensor circuit, having a startup phase and an operation phase, includes: a sensor configured to generate a sensor signal based on a measured property, wherein the sensor signal has a frequency spectrum defined by a first frequency and a second frequency that is greater than the first frequency; a signal processing circuit including an analog-to-digital converter (ADC) configured to convert the sensor signal into a digital sensor signal; and an offset diagnosis circuit. The offset diagnosis circuit includes: a low pass filter having a cutoff frequency less than the first frequency and configured to generate a filtered signal based on the digital sensor signal; an offset register configured to store a startup signal value of the filtered signal during the startup phase; and an offset comparator circuit configured to set a threshold range based on the startup signal value for use during the operation phase.
Public/Granted literature
- US20240213997A1 GAIN AND OFFSET DIAGNOSIS OF ANALOG-TO-DIGITAL CONVERTERS IN SENSOR SIGNAL PATH Public/Granted day:2024-06-27
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