Readout Circuit for Resistive and Capacitive Sensors

    公开(公告)号:US20190120879A1

    公开(公告)日:2019-04-25

    申请号:US15789199

    申请日:2017-10-20

    IPC分类号: G01R15/00

    摘要: A readout circuit for resistive and capacitive sensors includes a first input coupled to a reference resistor in a first mode of operation and coupled to a resistive sensor in a second mode of operation; a second input coupled to a capacitive sensor in the first mode of operation and coupled to a reference capacitor in the second mode of operation; and an output for providing a capacitive sensor data stream in the first mode of operation and for providing a resistive sensor data stream in the second mode of operation.

    Detecting capacitive faults and sensitivity faults in capacitive sensors

    公开(公告)号:US11953533B2

    公开(公告)日:2024-04-09

    申请号:US17347776

    申请日:2021-06-15

    IPC分类号: G01R31/28 G01R27/26 G01R27/28

    摘要: A capacitive sensor includes a first conductive structure; a second conductive structure that is counter to the first conductive structure, wherein the second conductive structure is movable relative to the first conductive structure in response to an external force acting thereon, wherein the second conductive structure is capacitively coupled to the first conductive structure to form a first capacitor having a first capacitance that changes with a change in a distance between the first conductive structure and second conductive structure; a signal generator configured to apply a first electrical signal step at an input or at an output of the first capacitor to induce a first voltage transient response at the output of first capacitor; and a diagnostic circuit configured to detect a fault in the capacitive sensor by measuring a first time constant of the first voltage transient response and detecting the fault based on the first time constant.

    System and method for high-ohmic circuit

    公开(公告)号:US10541683B2

    公开(公告)日:2020-01-21

    申请号:US15063067

    申请日:2016-03-07

    摘要: A high-ohmic circuit includes a plurality of high-ohmic branches coupled in parallel between a first node and a second node. Each of the plurality of high-ohmic branches includes a first plurality of series connected resistive elements forming a first series path from the first node to the second node, each of the first plurality of series connected resistive elements comprising a first diode-connected transistor. Each of the plurality of high-ohmic branches further includes a second plurality of series connected resistive elements forming a second series path from the first node to the second node, each of the second plurality of series connected resistive elements comprising a second diode-connected transistor. The high-ohmic circuit further includes a plurality of switches, each of the switches being coupled between a corresponding one of the plurality of high-ohmic branches and the second node.

    Capacitive sensor testing
    8.
    发明授权

    公开(公告)号:US10228414B2

    公开(公告)日:2019-03-12

    申请号:US15078453

    申请日:2016-03-23

    IPC分类号: G01R31/28 G01D5/24

    摘要: Sensor devices and methods are provided where a test signal is applied to a capacitive sensor. Furthermore, a bias voltage is applied to the capacitive sensor via a high impedance component. A path for applying the test signal excludes the high impedance component. Using this testing signal, in some implementations a capacity imbalance of the capacitive sensor may be detected.