Invention Grant
- Patent Title: Apparatus and method for calibrating mismatches of time-interleaved analog-to-digital converter
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Application No.: US17863167Application Date: 2022-07-12
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Publication No.: US12224759B2Publication Date: 2025-02-11
- Inventor: Jaerin Lee , Yang Azevedo Tavares , Minjae Lee , Kyeongkeun Kang
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2021-0090898 20210712
- Main IPC: H03M1/10
- IPC: H03M1/10 ; H03M1/06

Abstract:
An apparatus and a method of correcting a mismatch of a time-interleaved analog-to-digital converter are provided. The apparatus may include: a time-interleaved analog-to-digital converter configured to receive a non-return-to-zero (NRZ) signal in a correction mode and generate a first output signal, and including a plurality of analog-to-digital converters; and a mismatch corrector configured to generate a second output signal by processing the first output signal of the time-interleaved analog-to-digital converter based on parameters, wherein the parameters may be generated based on the first output signal of the time-interleaved analog-to-digital converter in the correction mode, and a period of the NRZ signal may be different from a product of a sampling period of the time-interleaved analog-to-digital converter and a number of the plurality of analog-to-digital converters included in the time-interleaved analog-to-digital converter.
Public/Granted literature
- US20230011449A1 APPARATUS AND METHOD FOR CALIBRATING MISMATCHES OF TIME-INTERLEAVED ANALOG-TO-DIGITAL CONVERTER Public/Granted day:2023-01-12
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