Invention Grant
- Patent Title: Method for measuring lesion of medical image
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Application No.: US17582717Application Date: 2022-01-24
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Publication No.: US12236585B2Publication Date: 2025-02-25
- Inventor: Yeong Won Kim , Kyungdoc Kim , Hong Seok Lee , Hyeongsub Kim
- Applicant: VUNO Inc.
- Applicant Address: KR Seoul
- Assignee: VUNO Inc.
- Current Assignee: VUNO Inc.
- Current Assignee Address: KR Seoul
- Agency: Seed IP Law Group LLP
- Priority: KR10-2021-0011021 20210126,KR10-2022-0003788 20220111
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06V10/40 ; G06V10/774 ; G06V10/776 ; G06V10/82 ; G16H30/40 ; G16H50/20 ; A61B6/00

Abstract:
According to the embodiment of the present disclosure, a method of analyzing a lesion based on a medical image performed by a computing device is disclosed. The method may include: extracting, by using a pre-trained artificial neural network, a first feature for each tile of a plurality of tiles included in an input image; and extracting, by using the pre-trained artificial neural network, a second feature for an entirety of the input image, based on information about whether the lesion is present for the each tile and information on a pattern of the lesion for the each tile generated based on first features of the plurality of tiles.
Public/Granted literature
- US20220237777A1 METHOD FOR MEASURING LESION OF MEDICAL IMAGE Public/Granted day:2022-07-28
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