- Patent Title: Crystallinity measurement device, resin-containing material manufacturing device, crystallinity measurement method, and resin-containing material manufacturing method
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Application No.: US17280038Application Date: 2019-09-20
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Publication No.: US12292382B2Publication Date: 2025-05-06
- Inventor: Nobuyuki Kamihara , Naomoto Ishikawa , Kiyoka Takagi , Sota Kamo , Makoto Yamaguchi , Mitsutoshi Jikei , Kazuya Matsumoto , Mikio Muraoka
- Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD. , AKITA UNIVERSITY
- Applicant Address: JP Tokyo; JP Akita
- Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.,AKITA UNIVERSITY
- Current Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.,AKITA UNIVERSITY
- Current Assignee Address: JP Tokyo; JP Akita
- Agency: HAUPTMAN HAM, LLP
- Priority: JP2018-183782 20180928
- International Application: PCT/JP2019/037094 WO 20190920
- International Announcement: WO2020/066940 WO 20200402
- Main IPC: G01N21/65
- IPC: G01N21/65 ; B29C71/00 ; B29C71/02 ; B29K101/12 ; G01N33/44
Abstract:
A crystallinity measurement device includes a Raman spectroscopy unit configured to acquire a Raman spectrum of resin-containing material including crystalline thermoplastic resin; and an analysis unit configured to calculate crystallinity of the crystalline thermoplastic resin based on an intensity of a low-wavenumber spectrum that is a spectrum in a region of less than 600 cm−1, in the Raman spectrum.
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