Invention Grant
- Patent Title: X-ray inspection apparatus and article handling system
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Application No.: US18174622Application Date: 2023-02-25
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Publication No.: US12292392B2Publication Date: 2025-05-06
- Inventor: Kazuyuki Sugimoto , Momoko Fujioka , Yoshiaki Sakagami
- Applicant: ISHIDA CO., LTD.
- Applicant Address: JP Kyoto
- Assignee: ISHIDA CO., LTD.
- Current Assignee: ISHIDA CO., LTD.
- Current Assignee Address: JP Kyoto
- Agency: Global IP Counselors, LLP
- Priority: JP2022-035330 20220308
- Main IPC: G01N23/04
- IPC: G01N23/04 ; B65G43/08 ; G01N23/083

Abstract:
An X-ray inspection apparatus includes a conveyance unit configured to convey articles, an X-ray irradiation unit configured to irradiate the articles conveyed by the conveyance unit with X-rays, an X-ray detection unit configured to detect X-rays transmitted through the articles, an image generation unit configured to generate an X-ray transmission image based on a detection result by the X-ray detection unit, and a calculation unit configured to calculate, based on the X-ray transmission image, the total amount of the articles conveyed per predetermined time by the conveyance unit.
Public/Granted literature
- US20230288347A1 X-RAY INSPECTION APPARATUS AND ARTICLE HANDLING SYSTEM Public/Granted day:2023-09-14
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