Invention Grant
- Patent Title: Diagnostic tool to tool matching and full-trace drill-down analysis methods for manufacturing equipment
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Application No.: US17586702Application Date: 2022-01-27
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Publication No.: US12298748B2Publication Date: 2025-05-13
- Inventor: Sejune Cheon , Jeong Jin Hong , Mikyung Shim , Xiaoqun Zou , Jinkyeong Lee , Sang Hong Kim
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Lowenstein Sandler LLP
- Main IPC: G05B19/418
- IPC: G05B19/418

Abstract:
A method includes receiving trace sensor data associated with a first manufacturing process of a processing chamber. The method further includes processing the trace sensor data using one or more trained machine learning models that generate a representation of the trace sensor data, and then generate reconstructed sensor data based on the representation of the trace sensor data. The method further includes comparing the trace sensor data to the reconstructed sensor data. The method further includes determining one or more differences between the reconstructed sensor data and the trace sensor data. The method further includes determining whether to recommend a corrective action associated with the processing chamber based on the one or more differences between the trace sensor data and the reconstructed sensor data.
Public/Granted literature
- US20230236586A1 DIAGNOSTIC TOOL TO TOOL MATCHING AND FULL-TRACE DRILL-DOWN ANALYASIS METHODS FOR MANUFACTURING EQUIPMENT Public/Granted day:2023-07-27
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