Invention Application
- Patent Title: Method for producing low carbon/oxygen conductive layers
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Application No.: US09923662Application Date: 2001-08-07
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Publication No.: US20010055869A1Publication Date: 2001-12-27
- Inventor: Eugene P. Marsh
- Applicant: Micron Technology, Inc.
- Applicant Address: null
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: null
- Main IPC: H01L021/8242
- IPC: H01L021/8242 ; H01L021/20 ; H01L021/44

Abstract:
The present invention provides a method for forming a substantially carbon- and oxygen-free conductive layer, wherein the layer can contain a metal and/or a metalloid material. According to the present invention, a substantially carbon- and oxygen-free conductive layer is formed in an oxidizing atmosphere in the presence of an organometallic catalyst using, for example, a chemical vapor deposition process. Such layers are particularly advantageous for use in memory devices, such as dynamic random access memory (DRAM) devices.
Public/Granted literature
- US06403414B2 Method for producing low carbon/oxygen conductive layers Public/Granted day:2002-06-11
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