发明申请
- 专利标题: Wavelength measurement apparatus
- 专利标题(中): 波长测量装置
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申请号: US10077673申请日: 2002-02-15
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公开(公告)号: US20020130252A1公开(公告)日: 2002-09-19
- 发明人: Seiji Funakawa
- 优先权: JPP.2001-038841 20010215; JPP.2001-065360 20010308
- 主分类号: G01J003/50
- IPC分类号: G01J003/50 ; G02B006/00
摘要:
Light under measurement whose wavelength is continuously swept is incident on fiber-optic Etalon. The fiber-optic Etalon transmits the light under measurement each time the wavelength of the light under measurement satisfies specific conditions. A PD detects the transmitted light of the fiber-optic Etalon and outputs the intensity of the light under measurement. A counter counts the number of peaks of the output of the PD. A CPU calculates the wavelength of the light under measurement based on the count value of the counter.
公开/授权文献
- US06795196B2 Wavelength measurement apparatus 公开/授权日:2004-09-21