发明申请
US20020164086A1 Method of quantitative determination of an image drift in digital imaging microscope
审中-公开
数字成像显微镜中图像漂移的定量测定方法
- 专利标题： Method of quantitative determination of an image drift in digital imaging microscope
- 专利标题（中）： 数字成像显微镜中图像漂移的定量测定方法
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申请号： US09848655申请日： 2001-05-04
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公开(公告)号： US20020164086A1公开(公告)日： 2002-11-07
- 发明人: Albert Sicignano , Dmitriy Yeremin
- 主分类号： G06T007/60
- IPC分类号： G06T007/60 ; G01B011/14 ; G06K009/52
摘要：
A method of quantitative determination of an image drift in a digital imaging microscope includes using a pattern which has a plurality of three-dimensional features spaced from one another into mutually perpendicular directions, producing a set of images of the pattern within certain time intervals therebetween, and determining an offset of each of the features in the set of the thusly obtained images as an image thrift.
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