Invention Application
- Patent Title: Composition and method of formation and use therefor in chemical-mechanical polishing
- Patent Title (中): 化学机械抛光的成型及其形成和使用方法
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Application No.: US10167564Application Date: 2002-06-11
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Publication No.: US20020185628A1Publication Date: 2002-12-12
- Inventor: Karl M. Robinson , Whonchee Lee
- Applicant: Micron Technology, Inc.
- Applicant Address: null
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: null
- Main IPC: C09K013/00
- IPC: C09K013/00

Abstract:
A composition and method of construction and use therefor in chemical-mechanical polishing (nullCMPnull) of one or more substrate assemblies is described. More particularly, a polishing solution comprising etchant, abrasive particles, and surfactant and methods of mixing to form and to dispense the polishing solution are described. One or more of the etchant, abrasive particles, and/or surfactant may comprise a liquid medium. Etchant, surfactant or abrasive particles may be premixed, mixed in-situ (nullpoint of use mixingnull), or any combination thereof. The surfactant may be ionic or nonionic. In particular, a polyoxyethylene may be used, and more particularly, a polyoxyethylene ester or ether may be used.
Public/Granted literature
- US06544435B2 Composition and method of formation and use therefor in chemical-mechanical polishing Public/Granted day:2003-04-08
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