Invention Application
- Patent Title: Method and system for slurry usage reduction in chemical mechanical polishing
- Patent Title (中): 化学机械抛光中浆料用量减少的方法和系统
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Application No.: US10050314Application Date: 2002-01-15
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Publication No.: US20030143924A1Publication Date: 2003-07-31
- Inventor: Kei-Wei Chen , Ting-Chun Wang , Shih-Tzung Chang , Yu-Ku Lin , Ying-Lang Wang , Ming-Wen Chen , Kuo-Hsiu Wei
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: null
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: null
- Main IPC: B24B049/00
- IPC: B24B049/00 ; B24B051/00 ; B24B001/00

Abstract:
A method and system is disclosed for reducing slurry usage in a chemical mechanical polishing operation utilizing at least one polishing pad thereof. Slurry can be intermittently supplied to a chemical mechanical polishing device. The slurry is generally flushed so that a portion of said slurry is trapped in a plurality of pores of at least one polishing pad associated with said chemical mechanical polishing device, wherein only a minimum amount of said slurry necessary is utilized to perform said chemical mechanical polishing operation, thereby reducing slurry usage and maintaining a consistent level of slurry removal rate performance and a decrease in particle defects thereof. The present invention thus discloses a method and system for intermittently delivering slurry to a chemical mechanical polishing device in a manner that significantly conserves slurry usage.
Public/Granted literature
- US06769959B2 Method and system for slurry usage reduction in chemical mechanical polishing Public/Granted day:2004-08-03
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