Invention Application
- Patent Title: Method and apparatus for measuring waveforms and wavelengths of optical signals
- Patent Title (中): 用于测量光信号波形和波长的方法和装置
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Application No.: US10641387Application Date: 2003-08-13
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Publication No.: US20040033072A1Publication Date: 2004-02-19
- Inventor: Yasuhisa Kaneko
- Priority: JP2002-235513 20020813
- Main IPC: H04J014/02
- IPC: H04J014/02

Abstract:
A method and apparatus for measuring characteristics of a single-wavelength optical signal constituting part of a wavelength division multiplexed (WDM) optical signal is provided. The WDM optical signal is adjustably diffracted to select the single-wavelength optical signal. An optical-to-electrical conversion is performed. An electrical sampling signal representing the selected single-wavelength optical signal is generated by one of (a) optically sampling the selected single-wavelength optical signal to generate an optical sampling signal on which the optical-to-electrical conversion is performed, and (b) electrically sampling an electrical signal generated by performing the optical-to-electrical conversion on the selected single-wavelength optical signal.
Public/Granted literature
- US07002680B2 Method and apparatus for measuring waveforms and wavelengths of optical signals Public/Granted day:2006-02-21
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