Invention Application
US20040033072A1 Method and apparatus for measuring waveforms and wavelengths of optical signals 失效
用于测量光信号波形和波长的方法和装置

  • Patent Title: Method and apparatus for measuring waveforms and wavelengths of optical signals
  • Patent Title (中): 用于测量光信号波形和波长的方法和装置
  • Application No.: US10641387
    Application Date: 2003-08-13
  • Publication No.: US20040033072A1
    Publication Date: 2004-02-19
  • Inventor: Yasuhisa Kaneko
  • Priority: JP2002-235513 20020813
  • Main IPC: H04J014/02
  • IPC: H04J014/02
Method and apparatus for measuring waveforms and wavelengths of optical signals
Abstract:
A method and apparatus for measuring characteristics of a single-wavelength optical signal constituting part of a wavelength division multiplexed (WDM) optical signal is provided. The WDM optical signal is adjustably diffracted to select the single-wavelength optical signal. An optical-to-electrical conversion is performed. An electrical sampling signal representing the selected single-wavelength optical signal is generated by one of (a) optically sampling the selected single-wavelength optical signal to generate an optical sampling signal on which the optical-to-electrical conversion is performed, and (b) electrically sampling an electrical signal generated by performing the optical-to-electrical conversion on the selected single-wavelength optical signal.
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