发明申请
- 专利标题： Inspection system for limited access spaces
- 专利标题（中）： 有限访问空间的检查系统
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申请号： US10252040申请日： 2002-09-23
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公开(公告)号： US20040057042A1公开(公告)日： 2004-03-25
- 发明人: Yuval Ovadia
- 申请人： S.T.I. Security Technology Integration Ltd.
- 申请人地址： null
- 专利权人： S.T.I. Security Technology Integration Ltd.
- 当前专利权人： S.T.I. Security Technology Integration Ltd.
- 当前专利权人地址： null
- 主分类号： G01N021/00
- IPC分类号： G01N021/00 ; G01N021/55
摘要：
A limited access space inspection system comprising: an imaging device for imaging a region in the limited access space, a mounting for mounting the imaging device to scan about the limited access space and a scanning control unit, associated with the imaging device, for controlling the imaging device to scan about the limited access space. The device is particularly useful for improving by automation, security checks customs checks and safety checks involving such awkward to access spaces.
公开/授权文献
- US07359042B2 Inspection system for limited access spaces 公开/授权日：2008-04-15
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