Invention Application
- Patent Title: Method for the programming of an anti-fuse, and associated programming circuit
- Patent Title (中): 用于编程防熔丝的方法以及相关的编程电路
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Application No.: US10638949Application Date: 2003-08-11
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Publication No.: US20040071007A1Publication Date: 2004-04-15
- Inventor: Stephane Pecheyran , Jean-Michel Moragues , Benjamin Duval
- Applicant: STMicroelectronics SA
- Applicant Address: FR Montrouge
- Assignee: STMicroelectronics SA
- Current Assignee: STMicroelectronics SA
- Current Assignee Address: FR Montrouge
- Priority: FR0210195 20020812
- Main IPC: G11C011/22
- IPC: G11C011/22

Abstract:
An anti-fuse transistor includes a source, a drain and a well connected together, and a gate. A method for programming the anti-fuse transistor includes applying a reference potential to the gate, and applying a high potential greater than the reference potential to the drain of the anti-fuse transistor. A first access transistor is connected to the anti-fuse transistor. The first access transistor includes a drain connected to the source of the anti-fuse transistor, and a source for receiving the high potential. Applying the high potential to the drain of the anti-fuse transistor includes turning on the first access transistor.
Public/Granted literature
- US06928021B2 Method for the programming of an anti-fuse, and associated programming circuit Public/Granted day:2005-08-09
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