发明申请
US20040112164A1 Alignment apparatus, exposure apparatus, and device manufacturing method 失效
对准装置,曝光装置和装置的制造方法

  • 专利标题: Alignment apparatus, exposure apparatus, and device manufacturing method
  • 专利标题(中): 对准装置,曝光装置和装置的制造方法
  • 申请号: US10670241
    申请日: 2003-09-26
  • 公开(公告)号: US20040112164A1
    公开(公告)日: 2004-06-17
  • 发明人: Toshiya AsanoYugo Shibata
  • 申请人: Canon Kabushiki Kaisha
  • 申请人地址: JP Tokyo
  • 专利权人: Canon Kabushiki Kaisha
  • 当前专利权人: Canon Kabushiki Kaisha
  • 当前专利权人地址: JP Tokyo
  • 优先权: JP2002-287056 20020930; JP2003-324688 20030917
  • 主分类号: G05G011/00
  • IPC分类号: G05G011/00
Alignment apparatus, exposure apparatus, and device manufacturing method
摘要:
An alignment apparatus moves an X-Y slider together with X and Y beams. Electromagnetic guides (electromagnetic mechanisms) are interposed between the X-Y slider, the X beam, and the Y beam. The electromagnetic guides include alignment and acceleration electromagnets attached to the X-Y slider, and targets attached to the X and Y beams. The alignment electromagnet is feedback-controlled, whereas the acceleration electromagnet is feedforward-controlled.
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