Invention Application
US20040192169A1 Chemical mechanical polishing endpoint detection system and method 失效
化学机械抛光终点检测系统及方法

Chemical mechanical polishing endpoint detection system and method
Abstract:
The system includes a polishing pad, a pad height sensor; a window; and a window raising mechanism. The polishing pad has an aperture with the window vertically moveable therein. The pad height sensor is positioned above the polishing pad and measures the vertical position of the pad before polishing. The window raising mechanism adjusts the vertical position of the window based on information from the pad height sensor. An endpoint measurement sensor can be disposed beneath the window for in-situ measurement of the polishing process.
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