Invention Application
- Patent Title: Vertical small angle x-ray scattering system
- Patent Title (中): 垂直小角度X射线散射系统
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Application No.: US10429926Application Date: 2003-05-05
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Publication No.: US20040223586A1Publication Date: 2004-11-11
- Inventor: Bob Baoping He , Rolf Dieter Schipper
- Applicant: Bruker AXS, Inc.
- Applicant Address: US WI Madison
- Assignee: Bruker AXS, Inc.
- Current Assignee: Bruker AXS, Inc.
- Current Assignee Address: US WI Madison
- Main IPC: G01N023/201
- IPC: G01N023/201

Abstract:
A small angle x-ray diffraction scattering system has a vertical orientation, allowing for simplified analysis of liquid samples. The system may function in a beam-up or a beam-down configuration. An x-ray source provides an initial x-ray beam that is directed vertically along a primary beampath to a sample located on a sample support. The small angle scattered x-ray energy travels through a secondary beampath to a detector. The primary and secondary beampaths may be evacuated and separated from a sample chamber by fluid seals. Beam conditioning optics and a collimator may be used in the primary beampath, and a beamstop used in the secondary beampath. The sample chamber may have a microscope or camera, which may be movable, for observing the sample, and a translation stage for moving the sample in at least two dimensions.
Public/Granted literature
- US06956928B2 Vertical small angle x-ray scattering system Public/Granted day:2005-10-18
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