公开(公告)号：US20040141585A1

公开(公告)日：2004-07-22

申请号：US10754972

申请日：2004-01-10

Inventor： Raymond J. Proctor

IPC: G01N023/04 ,  G01N023/201

CPC classification number: G01N23/22

Abstract: A material analyzer for identifying quantities of one or more elements in a material has a container for holding a material to be analyzed, a resonant gamma ray source unit for directing resonant gamma rays into the material in the container, and at least one detector for detecting gamma rays resonantly scattered by at least one predetermined element in the material. The resonant gamma ray source unit has an outer housing of gamma ray shield and neutron shield material, with an inner chamber and an aperture directed towards the container, a moving gamma ray generator source of a predetermined material mounted in the chamber, the material being selected from a predetermined group of materials which emit resonant gamma rays when exposed to neutrons, the source being directed towards said aperture, and a neutron source positioned in the chamber adjacent the gamma ray generator source.

Abstract translation: 用于识别材料中的一个或多个元件的量的材料分析器具有用于保持要分析的材料的容器，用于将共振伽马射线引导到容器中的材料的谐振伽马射线源单元，以及至少一个检测器 伽马射线通过材料中的至少一个预定元素共振地散射。 谐振伽马射线源单元具有伽马射线屏蔽和中子屏蔽材料的外部壳体，其具有指向容器的内部腔室和孔，安装在腔室中的预定材料的移动伽马射线发生器源，所选择的材料 来自在暴露于中子时发射共振伽马射线的预定的一组材料，源指向所述孔，以及定位在邻近伽马射线发生器源的腔室中的中子源。

公开(公告)号：US20010038680A1

公开(公告)日：2001-11-08

申请号：US09749978

申请日：2000-12-27

Inventor： Charles J. Davidson

IPC: G21K007/00 ,  G01N023/201

CPC classification number: A61B6/484 ,  A61B6/4092 ,  G01N23/04 ,  G21K2207/005

Abstract: As described in the methods of the present invention, x-ray photons derived from a microscopic solid-density plasma that is produced by optically focusing a high power laser beam upon a high atomic number target, may be use for phase-contast medical microimaging and also for absorptive microradiography. As described in the methods of the present invention, x-rays derived from a microscopic solid-density plasma are utilized as object illumination sources that are microscopic in at least one direction (so that ultrathin slicebeams and fan-beams are allowed, as are linear arrays of numerous clusterd parallel microbeams). Collimating optical devices of prior art are required.

Abstract translation: 如本发明的方法所述，通过将高功率激光束光学聚焦在高原子数目标上产生的微观固体密度等离子体衍生的X射线光子可用于相位医学微成像和 也用于吸收微射线照相。 如本发明的方法所述，从微观固体密度等离子体衍生的X射线被用作在至少一个方向上显微镜的对象照明源（使得允许超薄切片束和扇形束，如线性 许多簇并行微束阵列）。 需要现有技术的准直光学装置。

公开(公告)号：US20040223586A1

公开(公告)日：2004-11-11

申请号：US10429926

申请日：2003-05-05

Applicant: Bruker AXS, Inc.

Inventor： Bob Baoping He ,  Rolf Dieter Schipper

IPC: G01N023/201

CPC classification number: G01N23/201

Abstract: A small angle x-ray diffraction scattering system has a vertical orientation, allowing for simplified analysis of liquid samples. The system may function in a beam-up or a beam-down configuration. An x-ray source provides an initial x-ray beam that is directed vertically along a primary beampath to a sample located on a sample support. The small angle scattered x-ray energy travels through a secondary beampath to a detector. The primary and secondary beampaths may be evacuated and separated from a sample chamber by fluid seals. Beam conditioning optics and a collimator may be used in the primary beampath, and a beamstop used in the secondary beampath. The sample chamber may have a microscope or camera, which may be movable, for observing the sample, and a translation stage for moving the sample in at least two dimensions.

Abstract translation: 小角度X射线衍射散射系统具有垂直取向，从而简化了液体样品的分析。 该系统可以以波束形式或波束形式配置起作用。 x射线源提供了沿着主要波纹垂直定向到位于样品支架上的样品的初始x射线束。 小角散射X射线能量通过二次波纹传播到检测器。 可以通过流体密封将主要和次要的坡道抽出并与样品室分离。 光束调理光学元件和准直器可用于初级波纹管，以及在次级波峰中使用的波束抑制器。 样品室可以具有显微镜或照相机，其可以是可移动的，用于观察样品，以及用于在至少两个维度上移动样品的平移台。

公开(公告)号：US20040062452A1

公开(公告)日：2004-04-01

申请号：US10671786

申请日：2003-09-29

Applicant: FUJI PHOTO FILM CO., LTD.

Inventor： Hideyuki Sakaida

IPC: G06K009/36 ,  G06K009/40 ,  G01N023/201

CPC classification number: G06T5/50 ,  A61B6/4092 ,  A61B6/484 ,  G01N23/02 ,  G06T2207/30004

Abstract: A phase information restoring method improves estimation accuracy of phase by using radiation with energy of high transmittance when constructing a radiation image of a living organism such as a human body by the phase-contrast method. The phase information restoring method includes the steps of: (a) obtaining plural sets of detection data respectively representing plural kinds of radiation image information on a detection plane at a predetermined distance from an object by using plural radiations having different wavelengths with energy from 16 keV to 30 keV to detect intensity of the plural radiations transmitted through the object on the detection plane; and (b) restoring phase information on the radiations transmitted through the object on the basis of the plural sets of detection data so as to obtain phase data.

Abstract translation: 相位信息恢复方法通过使用通过相位对比法构建人体的生物体的放射线图像的方法，通过使用具有高透射能量的辐射来提高相位的估计精度。 相位信息恢复方法包括以下步骤：（a）通过使用具有来自16keV的能量的具有不同波长的多个辐射，分别表示在与物体隔开预定距离的检测平面上的多种放射线图像信息的多组检测数据 到30keV以检测在检测平面上通过物体传输的多个辐射的强度; 和（b）基于多组检测数据恢复通过物体发射的辐射的相位信息，以获得相位数据。

公开(公告)号：US20040008816A1

公开(公告)日：2004-01-15

申请号：US10457354

申请日：2003-06-10

Applicant: Rigaku Corporation.

Inventor： Kazuhito Hoshino ,  Yoshio Iwasaki

IPC: G01N023/201

CPC classification number: G01N23/201

Abstract: Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small angles with respect to the axis of an X-ray applied to film. From the positions of the peaks on the small-angle scattering curves and the X-ray intensities at these peaks, the molecular structure of the ion-exchange film is determined, thereby to evaluate the performance of the ion-exchange film.

Abstract translation: 本文公开了评价离子交换膜的性能的方法。 在该方法中，通过X射线测量装置获得离子交换膜的小角度散射曲线，该X射线测量装置可以检测相对于施加到膜的X射线的轴以小角度散射的X射线。 从这些峰的小角散射曲线上的峰位置和X射线强度的位置，确定离子交换膜的分子结构，评价离子交换膜的性能。

公开(公告)号：US20040218717A1

公开(公告)日：2004-11-04

申请号：US10861120

申请日：2004-06-04

Inventor： Louis N. Koppel ,  Craig E. Uhrich ,  Jon Opsal

IPC: G01N023/20 ,  G01N023/201

CPC classification number: G01N23/20

Abstract: In the calibration and alignment of an X-ray reflectometry (nullXRRnull) system for measuring thin films, an approach is presented for accurately determining C0 for each sample placement and for finding the incident X-ray intensity corresponding to each pixel of a detector array and thus permitting an amplitude calibration of the reflectometer system. Another approach involves aligning an angle-resolved X-ray reflectometer using a focusing optic, such as a Johansson crystal. Another approach relates to validating the focusing optic. Another approach relates to the alignment of the focusing optic with the X-ray source. Another approach concerns the correction of measurements errors caused by the tilt or slope of the sample. Yet another approach concerns the calibration of the vertical position of the sample.

公开(公告)号：US20040091079A1

公开(公告)日：2004-05-13

申请号：US10292985

申请日：2002-11-12

Inventor： Geordie Henry Zapalac

IPC: G01N023/201

CPC classification number: A61B6/583 ,  A61B6/032 ,  A61B6/4028

Abstract: Certain embodiments include a system and method for scatter measurement and correction. The method includes performing a calibration scan using a phantom to measure a scatter signal ratio between scatter x-rays impacting a first detector ring and scatter x-rays impacting a second detector ring. The scatter signal ratio is used to determine a scatter scale factor. The method further includes positioning a collimator such that the first detector ring is occluded from a path of primary x-rays generated by a target. The method also includes executing a low exposure scan to obtain x-ray scatter data using the first detector ring and the second detector ring and applying the scatter scale factor to the scatter data to produce scaled scatter data. The method further includes obtaining image data using the first detector ring and/or the said second detector ring and adjusting the image data using the scaled scatter data.

公开(公告)号：US20030031295A1

公开(公告)日：2003-02-13

申请号：US10099866

申请日：2002-03-14

Inventor： Geoffrey Harding

IPC: G01N023/201

CPC classification number: G01V5/0025 ,  G01N23/201

Abstract: A baggage inspection device based on coherent x-ray scatter has an x-ray source on one side of the scanning area and detectors on the other side of the scanning area. The detectors measure the energy of the scattered x-ray quanta. A primary ray collimator is arranged between scanning area and x-ray source. A secondary ray collimator for scattered rays is arranged between scanning area and detectors. The detectors are positioned on a Z axis forming an axis of symmetry for the secondary ray collimator. A point 0 on the Z axis forms the origin of a Cartesian coordinate system. The primary ray collimator allows passage only of x-ray beams impinging on the point 0. The x-ray source has an extended anode with a focus position controlled electronically about the anode length. Primary ray collimator and x-ray source extend cylindrically symmetrically about the symmetry axis or parallel to the Y axis in the X-Y plane.

Abstract translation: 基于相干X射线散射的行李检查装置在扫描区域的一侧具有x射线源，在扫描区域的另一侧具有检测器。 检测器测量散射x射线量子的能量。 主扫描准直仪布置在扫描区域和X射线源之间。 用于散射光线的二次射线准直器布置在扫描区域和检测器之间。 检测器位于Z轴上，形成二次射线准直仪的对称轴。 Z轴上的点0形成笛卡尔坐标系的原点。 主射线准直器仅允许穿过点0的X射线束通过.X射线源具有延伸的阳极，焦点位置以电子方式围绕阳极长度进行控制。 主射线准直器和X射线源围绕对称轴圆柱对称地延伸或平行于X-Y平面中的Y轴延伸。

公开(公告)号：US20020094061A1

公开(公告)日：2002-07-18

申请号：US10047970

申请日：2002-01-16

Applicant: YXLON International X-Ray GmbH

Inventor： Gerhard Martens

IPC: G01N023/201

CPC classification number: G01N23/20

Abstract: An apparatus for measuring the pulse transmission spectrum of elastically scattered quantities includes at least one diaphragm displaceable in a y-direction for switching between fine and coarse local resolution of the examined partial volumes of an examination object, wherein the diaphragm narrows the effective ray width transversely of a scanning direction, and a diaphragm system displaceable in a x-direction for limiting and extension of the partial volume in a z-direction, wherein the diaphragm system includes at least two circular ring diaphragms arranged one above the other and identical with respect to their circular ring structure, and wherein the circular ring diaphragms are arranged at a relative offset for reducing an effective imaging slot width or a detector slot width.

Abstract translation: 用于测量弹性散射量的脉冲透射光谱的装置包括至少一个在y方向上可移位的光阑，用于在检查对象的被检查的部分体积的精细和粗略的局部分辨率之间切换，其中光阑使有效射线宽度横向变窄 以及可沿x方向移位的隔膜系统，用于限制和延伸在z方向上的部分体积，其中所述隔膜系统包括至少两个环形隔膜，所述至少两个环形隔膜相对于 它们的圆环结构，并且其中圆形环隔膜布置在相对偏移处以减小有效成像槽宽度或检测器槽宽度。

公开(公告)号：US20040264649A1

公开(公告)日：2004-12-30

申请号：US10834694

申请日：2004-04-29

Inventor： Peter Jahrling

IPC: G01N023/201

CPC classification number: A61B6/0442 ,  A61B6/4283

Abstract: A patient table for radiation image exposure has a top surface forming a patient positioning surface that has an integrated solid-state radiation detector with a size substantially corresponding to the size of the patient positioning surface.

Abstract translation: 用于放射线图像曝光的患者台具有形成患者定位表面的顶表面，其具有基本上对应于患者定位表面的尺寸的尺寸的集成固态放射线检测器。