Invention Application
US20040253751A1 Photothermal ultra-shallow junction monitoring system with UV pump
审中-公开
光热超浅层结合监测系统与UV泵
- Patent Title: Photothermal ultra-shallow junction monitoring system with UV pump
- Patent Title (中): 光热超浅层结合监测系统与UV泵
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Application No.: US10859846Application Date: 2004-06-03
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Publication No.: US20040253751A1Publication Date: 2004-12-16
- Inventor: Alex Salnik , Lena Nicolaides , Jon Opsal
- Main IPC: H01L021/66
- IPC: H01L021/66 ; G01R031/26 ; G01J001/42 ; G01J003/45 ; G01B009/02

Abstract:
A modulated reflectance measurement system includes two lasers for generating a probe beam and an intensity modulated pump beam. The probe beam is in the visible spectrum and the pump beam is in the ultra-violet spectrum. The pump and probe beams are joined into a collinear beam and focused by an objective lens onto a sample. Reflected energy returns through the objective and is redirected by a beam splitter to a detector. A lock-in amplifier converts the output of the detector to produce quadrature (Q) and in-phase (I) signals for analysis. A processor uses the Q and/or I signals to analyze the sample.
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