发明申请
- 专利标题: Fail judging method for analysis and analyzer
- 专利标题(中): 分析和分析器故障判断方法
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申请号: US10496209申请日: 2002-11-18
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公开(公告)号: US20050000829A1公开(公告)日: 2005-01-06
- 发明人: Yoshimitsu Morita , Teppei Shinno
- 申请人: Yoshimitsu Morita , Teppei Shinno
- 优先权: JP2001355324 20011120
- 国际申请: PCT/JP02/12035 WO 20021118
- 主分类号: G01N27/416
- IPC分类号: G01N27/416 ; G01N27/49 ; G01N33/487 ; G01N27/26 ; C25B11/00 ; C25B13/00
摘要:
An analyzer (A) includes a measurer (42) for measuring an electro-physical quantity of a sample, and an acceleration measurer (43) for computing the acceleration of change of the electro-physical quantity such as a current measured by the measurer (42). The fail determination as to whether or not a predetermined condition necessary for performing analysis of the sample is satisfied is made based on the acceleration computed by the acceleration measurer (43). As a result, the fail determination in the analysis process of the sample can be performed accurately.
公开/授权文献
- US07083712B2 Fail judging method for analysis and analyzer 公开/授权日:2006-08-01
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