The present invention relates to a flat display apparatus and a flat display apparatus testing method, and is, for example, applicable to a liquid crystal display apparatus where drive circuits are integrally formed on an insulating substrate. The present invention is capable of carrying out a reliable screening of defective pixels so as to effectively avoid deterioration in reliability even in cases where transistors with low withstand voltages are employed. A common line-side wiring pattern COM of wiring patterns LCC and COM of a capacitor of pixels is connected to a precharge circuit externally in an independent manner.