Invention Application
US20050030601A1 System and method for scanner instrument calibration using a calibration standard
审中-公开
使用校准标准进行扫描仪仪器校准的系统和方法
- Patent Title: System and method for scanner instrument calibration using a calibration standard
- Patent Title (中): 使用校准标准进行扫描仪仪器校准的系统和方法
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Application No.: US10868590Application Date: 2004-06-14
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Publication No.: US20050030601A1Publication Date: 2005-02-10
- Inventor: David Smith , Gregory Loney , Nathan Weiner , Christopher Miles , Albert Bukys , Akim Lennhoff , Robert Kuimelis
- Applicant: David Smith , Gregory Loney , Nathan Weiner , Christopher Miles , Albert Bukys , Akim Lennhoff , Robert Kuimelis
- Applicant Address: US CA Santa Clara
- Assignee: Affymetrix, INC.
- Current Assignee: Affymetrix, INC.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G01N21/27
- IPC: G01N21/27 ; G01N21/64 ; G06F15/00

Abstract:
In one embodiment a method for reducing variation in a plurality of scanners is described. The method comprises directing an excitation beam at a calibration standard in each of the plurality of scanners, where one of the plurality of scanners is a designated scanner; detecting emission data for each of the plurality of scanners from a plurality of fluorescent molecules disposed on the calibration standard, where the emission data is responsive to the excitation beam; determining variation in the emission data of one or more of the plurality of scanners based, at least in part, upon the emission data of the designated scanner; and adjusting one or more parameters in one or more of the plurality of scanners based, at least in part, upon the determined variation.
Information query