发明申请
- 专利标题: Analog circuit automatic calibration system
- 专利标题(中): 模拟电路自动校准系统
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申请号: US10915345申请日: 2004-08-11
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公开(公告)号: US20050049809A1公开(公告)日: 2005-03-03
- 发明人: Shiro Dosho , Naoshi Yanagisawa , Masaomi Toyama , Keijiro Umehara
- 申请人: Shiro Dosho , Naoshi Yanagisawa , Masaomi Toyama , Keijiro Umehara
- 专利权人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- 当前专利权人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- 优先权: JP2003-302986 20030827
- 主分类号: G01R31/316
- IPC分类号: G01R31/316 ; G01R35/00 ; G06F19/00
摘要:
An analog circuit automatic calibration system for calibrating an object circuit that is an analog circuit having a characteristic changing with an input set value. The system includes: a set value storage section for storing a value and outputting the value to the object circuit as the set value; a characteristic detection section for detecting the characteristic of the object circuit; a first characteristic change section for determining the set value so that the characteristic of the object circuit is optimized; a second characteristic change section for updating the set value so that the characteristic of the object circuit is maintained, using an algorithm different from that used in the first characteristic change section; and a selector for selecting either one of the outputs of the first and second characteristic sections to enable the selected one to be stored in the set value storage section.
公开/授权文献
- US07254507B2 Analog circuit automatic calibration system 公开/授权日:2007-08-07
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