发明申请
- 专利标题: Glitch and metastability checks using signal characteristics
- 专利标题(中): 毛刺和亚稳态检查使用信号特征
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申请号: US10729785申请日: 2003-12-05
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公开(公告)号: US20050049844A1公开(公告)日: 2005-03-03
- 发明人: You-Pang Wei , Yuhung Liao , Mingchi Liu , YuJiao Ping
- 申请人: You-Pang Wei , Yuhung Liao , Mingchi Liu , YuJiao Ping
- 申请人地址: US CA Santa Clara
- 专利权人: Legend Design Technology, Inc.
- 当前专利权人: Legend Design Technology, Inc.
- 当前专利权人地址: US CA Santa Clara
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
In accordance with the present invention there is provided a method for performing a glitch check in simulating a circuit. Current maximum and minimum values for optimization parameters of the circuit are determined. Next, a signal pulse characteristic for the circuit simulation is determined based on the maximum and minimum optimization parameters. A current averaged optimization parameter is determined from the current maximum and minimum optimization parameters. A prime criterion parameter is calculated based on the optimization parameters and the signal pulse characteristic value. If the prime criterion parameter converges into a specified range then measurement results from the circuit simulation are parsed and reported as final. If the prime criterion parameter does not converge, then the process continues by recalculating the optimization parameters until the prime criterion parameter converges.
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